Description
Rigaku Innovative Technologies Europe s.r.o. (RITE) belongs to the Rigaku Corporation group (Tokyo, Japan). RITE is European center of excellence for the design, development and manufacturing of X-ray optics, X-ray detectors and X-ray sources, as well as other related scientific products for industry and research.
Competences and capabilities
RITE expertise and experience focuses on various optical technologies (especially replicated and Multi-Foil X-ray Optics), X-ray imaging and X-ray sources. RITE and its specialists can, due their long experience, test facilities and measurement devices, offer consultations and expertise in these fields.
Products/Services
- X-ray optics (Lobster Eye, Kirkpatrick-Baez system, ellipsoidal, parabolic and Wolter I optics)
- X-ray detectors
Major Space Projects & References
- VZLUSAT2 mission - X-ray optical payload equipped with Rigaku X-ray Optics and miniaturized TimePix detector with CdTe sensor (www.vzlusat2.cz)
- VZLUSAT1 mission - Experimental verification of space products and technologies on nanosatellite (www.vzlusat1.cz)
- Wide X-ray System for X-ray imaging with detector Timepix – rocket experiments (assembled at Penn State University), co-operation with CTU
- Space radiation capabilities, technologies and platforms for small spacecraft and CubeSats (SR-CTP) - the second-generation Czech CubeSat was built at the QEM level which includes radiation composite shielding, X-ray optics telescope coupled to a pixel detector Timepix as X-ray focal plane detector, and outgassing sensors
- Novel X-ray Optics Technologies for ESA X-ray Astrophysics Missions – ESA PECS Applications of Kirkpatrick Baez Imaging Systems in Space – co-operation with Colorado, Iowa University and CTU
Space Related Equipment, Labs & Certificates
- AFM, SEM and confocal microscope
- Contact profilometer
- Software for design and ray-tracing of X-ray optics for space and laboratory applications
- X-ray optical test bench
- X-ray optical vacuum test bench
- Laboratory equipment for X-ray detectors and X-ray optics characterization